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The new laser-based IX3 Z-Drift Compensator (IX3-ZDC) ensures that samples are always in focus, therefore producing the sharpest images possible. The near-infrared laser allows users to instantly focus on high magnification samples and also maintain focus over long-term, time-lapse experiment.
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The IX3-ZDC uses minimally phototoxic, infrared (IR) light to detect the correct focus position (set by the user). The system features ”continuous” and “one-shot” modes. The one-shot mode allows several focus positions to be set, therefore enabling efficient Z-stack acquisition in multi-position experiments. The continuous mode is best suited for fast time-lapse image capture. This mode compensates for focus drift caused by temperature changes or the addition of reagents, making it ideal for more sensitive applications such as TIRF. The IX3-ZDC continually monitors the distance between the objective lens and the sample surface to maintain an accurate focus, even during the fastest time-lapse experiments.
The IX83 microscope frame is designed with a specialized deck that allows the IX3-ZDC to be slipped easily into the infinite light path. The IX3-ZDC is mounted and connected directly to the microscope frame, enabling easy and immediate communication with the touch panel controller (TPC) and cellSens software. Though the IX3-ZDC can be operated through the TPC alone, cellSens software can simplify control and allow for advanced operations such as time-lapse imaging.
cellSens is not for clinical diagnostic use
The real-time, Z-drift compensation system combined with the Olympus ultrasonic stage is perfectly suited for capturing high-precision, multipoint time-lapse images that are never out of focus or misaligned. Additionally, the system employs near-infrared light to minimize cell damage during prolonged experimentation.
One-shot mode | Continuous mode | ||
---|---|---|---|
Focusing position | Dry objective | Interface between air and cover glass | |
Immersion objective | Interface between sample (cultured liquid) and cover glass | ||
Offset method | Controlled by software | Setting the offset from detectable cover slip to the focusing plane by Z-axis control | |
Observation methods | Brightfield, DIC, fluorescence and phase contrast | Brightfield and phase contrast | |
FN limitation | Light volume is low at the image perimeter for FN 22 when using 2X, 4X, 10X objectives | ||
Focusing speed | Controlled by Software | ||
Focusing accuracy | Dry objective | Standard deviation: σ = 0.07 µm | |
Immersion objective | Standard deviation: σ = 0.1 µm | ||
Laser | Laser diode 790 nm, 40 µW | ||
Detector | Dual partitioning detector | ||
Laser safety standard | Class 1 (JISC6802, IFC60825, CDRH) |
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