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The total internal reflection fluorescence unit expands the FLUOVIEW FV1200 confocal laser scanning microscope to incorporate TIRF microscopy capabilities. Making use of the already existing confocal laser lines, it is also a very cost-effective method to upgrade the microscope for more experimental methods. The option of TIRF or laser confocal imaging allows the acquisition of high signal-to-noise images of events occurring close to the specimen (cover slip) surface, and enables observation of intracellular structures in three dimensions at numerous Z-axis positions.

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Caractéristiques
Caractéristiques techniques

Caractéristiques

Combine TIRFM and cLSM

Adding the TIRF module to the FLUOVIEW FV1200 scanning unit enables the user to perform total internal reflection fluorescence microscopy and confocal laser scanning microscopy on the same frame and sample.

Use Existing Laser Lines from FV1200

Using the laser light source already available with the FV1200 confocal laser scanning microscope, the addition of the TIRF module is a very cost-effective upgrade.

Full Computer Control of the Laser Path

Motorization allows the system to save previously set alignment positions for enhanced ease of imaging and totally reproducible TIRF illumination protocols. In addition, the angle of the laser can be fine-tuned for manual selection of penetration depths.

Fully Compatible with FV1000

This unit is fully compatible with the FLUOVIEW FV1000 systems.

Caractéristiques techniques

Laser lines	405 to 635 nm
System Control	Motorized penetration ratio adjustment
System Control	Automatic optical setting for TIRFM objectives

FV1200 TIRF Module